TALENTS BROUGHT IN BY IHEP    

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DONG Yuhui, born in Hainan Province in June of 1970, joined IHEP under a national program of ¡°Introducing Outstanding Young Scientists Abroad¡± in 2000.

He graduated from the Department of Physics, Zhongshan University and got his B.S degree there in 1990. Then he got  Ph.D degree at IHEP in 1995. He did research as postdoc at the Surface Physics Key National Laboratory, the Institute of Physics (IOP) during 1995 ¨C 1997. Supported by ICTP, he did research at Trento University from 1997- 1998. And then from 1998 ¨C 2000, he did research at the Material Engineering Department of Trento University as a guest scientist.

He is full professor, tutor of Ph.D students and standing member of the Science Committee of IHEP.

During his research at IOP, he discovered for the first time the existence of interface state on the surface of ferro-magnetic/para-magnetic metal and expounded that the interface state on the surface of Fe/Cu{111} evolved from the interface state in the same position of Cu{111} surface Brillouian zone.

During his stay in Italy, his efforts were mainly centered on the study of magnetron sputtering growth of thin film and analysis of x ray structure. To be specific, he carried out research in the following two fields:

1) Stress of thin film materials and development of x ray experimental methods for studying the stress as well as study of the texture of thin film and inhomogeneity of stress. He put forward the new method of studying texture and stress gradient using SR x ray diffraction.

2) Development of new method for data analysis of x ray diffraction and relevant computing software. He built MarqX software package. Through the whole profile fitting and Fourier transformation, the structure and defect of the material were given.

The subject he undertakes is ¡° Study of the New Method in SR Diffraction¡±.

Telephone£º(010) 68235998 (O)

E-mail£ºdongyh@mail.ihep.ac.cn     

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Institute of High Energy Physics, Chinese Academy of Sciences 07/08/02